Hydrogen Induced Cracking (HIC) PT


The molecular hydrogen formed in situ produces blisters, and adjacent blisters subsequently are connected on different planes in the metal.

HIC can be confused with laminations or volumetric inclusions.

Typical detection with phased-array is done with L0 electronic scanning which cannot see the connections between the cracks.

TFM

It allows to see directly the connexion between the defects making it possible to distinguish between laminations and HIC damages.

Electronic Scanning