Analysis on M2M Gekko Capture 2.3


By Frederic Reverdy, M2M Product Sales Specialist at Eddyfi Technologies

The following image is an inspection done with two phased-array probes.

In the new version of M2M Capture, it is now possible to associate a different palette to each group allowing to quickly identify each one of them.

It is also possible to change the dynamic range of each palette individually. It is possible to adjust easily the Scan/Index offsets and to change the orientation of the probes in acquisition and analysis. In this example, the two probes were not well centered, we change their Index offset to make sure that the lack-of-side-wall fusion and the crack along the chamfer for each group are properly aligned with the overlay of the weld.

Of course, the 800% dynamic range is still there to perform measurements of echoes that displays an amplitude above 100% screen height.  

#Capture #Gekko #Mantis #Eddyfi

 

Analysis on the Gekko Capture 2.3