One advantage using a MultiX++ full parallel system is the possibility to fire several apertures simultaneously on one or several probes improving greatly the productivity of an inspection.
SEVERAL APERTURES FIRED SIMULTANEOUSLY
For a 128-element system, up to 4 sub-apertures can be fired in parallel leading to gains in productivity of nearly x4 with no compromise on the resolution. The following illustration shows the example of four sub-apertures fired simultaneously using the fast mode interface.
SEQUENTIAL MODE - MIXED MODE - FAST MODE COMPARISON
INSPECTION OF ALUMINUM PLATES: 4 POSSIBLE MODES USING M2M PHASED-ARRAY SYSTEM
Mode 1: sequential mode / electronic scanning (purely sequential)
Mode 2: mixed mode (mix of sequential and parallel firing)
Mode 3: fast mode (full parallel reconstructions)
Mode 4: super resolution mode using Full Matrix Capture/Total Focusing Method (explained here)
MODE 1 : SEQUENTIAL MODE
MODE 2: MIXED MODE
MODE 3: FAST MODE
TIME DIFFERENCE IN BETWEEN MODES
COMPARISON BETWEEN MODE 1, 2 AND 3 ON A FBH (1.2MM DIAMETER LOCATED AT 10MM FROM THE BOTTOM OF A 100MM BLOCK)
ORDER OF MAGNITUDE FOR SPEED INCREASE
FAST MODE INDUSTRIAL APPLICATION
HIGH SPEED COMPOSITE INSPECTION
A carbon epoxy plate was inspected with a MultiX++ system using the new Multi2000 V8 version. Thanks to the parallel architecture of the MultiX++, two sub-apertures were fired in parallel with a 64-element probe. A substantial improvement (x2) of the inspection speed, up to 400mm/s, has been obtained with a pixel resolution of 0.5x0.5mm, including full A-Scan storage. Multi2000 V8 is linked directly to CIVA Analysis for powerful post-processing, analysis and 3D visualization of defects.